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Jeol JSM-6500F Field Emission Scanning Electron Microscope with Oxford Instruments INCA Wave, INCA X-Sight 7558, Incawave MICSF+ and X-stream 2 Co...
Jeol JSM-6500F Field Emission Scanning Electron Microscope with Oxford Instruments INCA Wave, INCA X-Sight 7558, Incawave MICSF+ and X-stream 2 Co...
Jeol JSM-IT300LA Analytical Scanning Electron Microscope with (2) Ulvac Kiko G-100DD Vacuum Pumps, Computer Station, No, Computer S/N MP1382001340...
JEOL JEM-100S ELECTRON MICROSCOPE PARTS AND REPAIR WEIGHT 1680 LBS